For reprints of any of these, please contact me.
Last modified 11/10/04.
1) ``Application of Single Electron Tunneling: Precision Capacitance
Ratio Measurements'',
Appl. Phys. Lett. 66, 2588 (1995).
Alan F. Clark, Neil
M. Zimmerman, Edwin R. Williams, A. Amar, Dian Song, F.
C. Wellstood, C.
J. Lobb , and R. J. Soulen, Jr.
Total 80 k: pdf
2) ``Capacitors with Very Low Loss: Cryogenic Vacuum-Gap Capacitors'',
IEEE Trans. Inst. Meas. 45, 841 (1996)
Neil M.
Zimmerman.
Total 655 k: pdf
3) ``Accuracy of Electron Counting Using a 7-Junction Electron Pump'',
Appl. Phys. Lett. 69, 1804 (1996).
Mark
W. Keller,
John M. Martinis, Neil
M. Zimmerman, and Andrew H. Steinbach.
Total 120 k: pdf
4) "Recent Results and Future Challenges for the NIST Charged-Capacitor
Experiment",
IEEE Trans. Inst. Meas. 46, 294 (1997).
Neil M.
Zimmerman, Jonathan L. Cobb, Alan F. Clark.
Total 154 k: pdf
5) "A Seven-Junction Electron Pump: Design, Fabrication, and Operation",
IEEE Trans. Inst. Meas. 46, 307 (1997).
Mark
W. Keller,
John M. Martinis, Andrew H. Steinbach, and Neil
M. Zimmerman.
Total 77 k: pdf.
6) "Modulation of the charge of a single-electron transistor by distant
defects",
Physical Rev. B 56, 15 September 1997-II.
Neil M.
Zimmerman, Jonathan L. Cobb, Alan F. Clark.
Total 120 k: pdf
7) "A simple fabrication method for nanometer-scale thin-metal stencils".
J. Vac. Sci. Technol. B 15, 369 (1997).
Neil M.
Zimmerman.
Total 420 k: pdf
8) "A primer on electrical units in the Systeme Internationale".
Amer. J. Phys 66, 324 (1998).
Neil M.
Zimmerman.
Total 850 k: pdf
9) "Dynamics of a Charged Fluctuator in an Al-AlOx-Al single-electron
transistor".
Journal of Low Temperature Physics 123, Nos. 1/2, pp. 103-126
(2001).
M. Kenyon, A. Amar, Dian Song, F.
C. Wellstood, C.
J. Lobb, Jonathan L. Cobb, Neil
M. Zimmerman
Total 8 MB (bit-mapped image): pdf
10) "Behavior of a Charged Two-Level Fluctuator in an Al-AlOx-Al single-electron
transistor".
IEEE Trans. Appl. Supercond. 9, 4261 (1999).
M. Kenyon, Jonathan L. Cobb, A. Amar, Dian Song, F.
C. Wellstood, C.
J. Lobb, Neil
M. Zimmerman
Total 350 k: pdf
11) "A Capacitance Standard Based on Counting Electrons".
Science 285, 1706 (1999).
Mark
W. Keller, Ali L. Eichenberger, John
M. Martinis, Neil
M. Zimmerman.
Total 150 k: pdf
12) "Dynamic Input Capacitance of Single-Electron Transistors and the
Effect on Charge-Sensitive Electrometers".
J. Appl. Phys. 87, 8570 (2000).
Neil M.
Zimmerman and Mark
W. Keller
Total 90 k: pdf
13) "Frequency Dependence of a Capacitance Standard Based on SET Devices'',
J. Low Temperature Physics 118, 317 (2000).
Ali L. Eichenberger, Mark
W. Keller, John
M. Martinis, Neil
M. Zimmerman.
Total 2 MB: pdf
14) "Electrical Conductivity of Xenon at Megabar Pressures", Phys.
Rev. Lett. 85, 2797 (2000).
Mikhail I. Eremets, Eugene A. Gregoryanz, Victor V. Struzhkin, Ho-kwang
Mao, Russell J. Hemley, Norbert Mulders,
Neil M. Zimmerman.
Total 200 k: pdf
15) "Coulomb-Blockade Devices as a Microscope of Low-Temperature Dynamics
in Disordered Materials",
submitted. (2001).
William H. Huber, Neil
M. Zimmerman.
Total 600 k: pdf
16) "Excellent Charge Offset Stability in a Si-Based Single-Electron
Tunneling Transistor",
Appl. Phys. Lett. 79, 3188 (2001).
Neil M. Zimmerman,
William H. Huber, Akira
Fujiwara, Yasuo Takahashi.
Total 80 k: pdf
17) "Long-Term Charge Offset Noise in Coulomb-Blockade Devices", Experimental
Implementation of Quantum Computation (IQC'01) 76 (Rinton Press,
Princeton, NJ, 2001).
pdf
William H. Huber, Stuart B. Martin, Neil
M. Zimmerman.
Total 1270 k: pdf
18) "Electrical Metrology with Single Electrons",
Meas. Sci. Technol. 14, 1237–1242 (2003).
Neil M.
Zimmerman and Mark
W. Keller
Total 300 k: pdf
19) "Larger Value and SI Measurement of the Improved Cryogenic Capacitor
for the Electron-Counting Capacitance Standard"
IEEE Transactions on Instrumentation and Measurement 52, 608
- 11 (2003)
Neil M.
Zimmerman, Mahmoud A. El Sabbagh, and Yicheng Wang.
Total 550 k: pdf
20) "Using a High-Value Resistor in Triangle Comparisons of Electrical
Standards"
IEEE Transactions on Instrumentation and Measurement 52, 590
- 3 (2003)
Randolph E. Elmquist, Neil
M. Zimmerman, and William H. Huber
Total 270 k: pdf
21) "Turnstile Operation Using a Silicon Dual-Gate Single-Electron
Transistor"
Jpn. J. Appl. Phys 42, L1109 - 11 (2003).
Yukinori Ono,
Neil
M. Zimmerman,
Kenji
Yamazaki and Yasuo
Takahashi.
Total 310 k: pdf
22) "Current quantization due to single-electron transfer in Si-wire
charge-coupled devices"
Appl. Phys. Lett. 84, 1323 (2004)
Akira Fujiwara,
Neil
M. Zimmerman,
Yukinori
Ono,
Yasuo Takahashi.
Total 300 k: pdf
23) "Error Mechanisms and Rates in Tunable-Barrier Single-Electron Turnstiles
and CCD’s"
J. Appl. Phys. 96, 5254 - 66 (2004).
Neil M. Zimmerman,
Emmanouel Hourdakis, Yukinori
Ono, Akira
Fujiwara, Yasuo Takahashi.
Total 470 k: pdf
24) ""
(2004).
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