Allen R. Hefner, Jr.
Allen R. Hefner, Jr. was born in Washington D. C. on June 29 1959. He received the B.S., M.S., and Ph.D. degrees in electrical engineering from the University of Maryland in 1983, 1985, and 1987 respectively.
Dr. Hefner joined the Semiconductor Electronics Division of the National Institute of Standards and Technology in 1983. He is presently the Project Leader for the Metrology for System-on-a-Chip Project and the Power Device and Thermal Metrology Project. He is also the NIST Research Advisory Committee member for the NIST Electronic and Electrical Engineering Laboratory (1997-1999). In 1993, Dr. Hefner received a U.S. Department of Commerce Silver Metal Award for his pioneering work in modeling advanced power semiconductor devices for electro-thermal circuit simulation. He was also the recipient of the 1996 NIST Applied Research Award for development and transfer of the IGBT model to circuit simulator software vendors.
Dr. Hefner's research interests include characterization, modeling, and circuit utilization of power semiconductor devices. He is the author of 30 publications in IEEE Transactions and Conference proceedings, and is the recipient of an IEEE Industry Applications Society prize paper award. He has presented 20 invited seminars and was an instructor for the IEEE Power Electronic Specialist Conference tutorial course (1991 and 1993) and for the IEEE Industry Applications Society Meeting tutorial course (1994). Dr. Hefner has served as a program committee member for the IEEE Power Electronics Specialist Conference (1991-1999) and as the Transactions Review Chairman for the IEEE Industry Applications Society Power Electronics Devices and Components Committee (1989-1997). He has also served as the IEEE Electron Device Society Standards Technical Committee Chairman (1996-1999) and is a member of the IEEE Electron Devices Society Power Devices and Integrated Circuits Technical Committee. He is also the founder and Chairman of the NIST/IEEE Working Group on Model Validation.
