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Sources of Error
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Check the following:
- Are the probes or wires making good contact to the sample?
- Are the contact I-V characteristics linear?
- Is any contact much higher in resistance than the others?
- Do the voltages reach equilibrium quickly after current reversal (there will be some delay for semi-insulating GaAs)?
- Is there visible damage (cracks, especially around the contacts)?
- Is the sample in the dark?
- Is the sample temperature uniform?
- If there are large temperature gradients across the wiring, are dissimilar wiring materials being used?
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| Main Page | I. Introduction | II. The Hall Effect | evolution of resistance concepts |
| the Hall effect and the Lorentz force | the van der Pauw technique |
| III. Resistivity and Hall Measurements | sample geometry | definitions for resistivity measurements |
| resistivity measurements | resistivity calculations | definitions for Hall measurements |
| Hall measurements | Hall calculations | Sample Hall Worksheet | Worksheet with Typical Data | IV. Algorithm |
| V. References | VI. Leave or View Comments | figure 1 | figure 2 | | figure 3 | figure 4 |
NIST is an agency of the U.S. Commerce Department
Date created: 12/4/2000
Last updated: 8/14/2007 |
