CMOS and Novel Devices Group
Contact: John S. Suehle
The CMOS and Novel Devices Group performs research and development for the metrology, test structures, and reference materials required for CMOS and Beyond devices and their constituent materials.
THE GROUP
- emphasizes metal-oxide-semiconductor devices as well as future replacement devices such as molecular electronic and quantum electronic devices.
- emphasizes starting materials, thin films, dopants, and materials for future devices such as molecular layers and quantum dots.
- collaborates with the semiconductor and related electronics industries, universities, standards groups, and other government agencies to conduct research and achieve technology transfer.
PROJECTS
Nanoelectronic Device Metrology
Curt Richter, Project Leader
- develops metrology and test structures that will enable nanotechnologies to supplement and/or supplant CMOS devices.
- focuses on molecular electronics and confined silicon devices.
Macro Electronics
David Gundlach, Project Leader
- elucidates an accurate and physics-based understanding of the operation of organic semiconductor layers.
Advanced MOS Device Reliability and Characterization
John Suehle, Project Leader
- provides electrical and reliability measurement techniques, data, physical models, and fundamental understanding for MOS devices with ultra-thin oxide and alternate gate dielectrics.
