Division Staff
DIVISION OFFICE
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David G. Seiler, Chief
Lori A. Guariglia, Division Office Manager
Sharon W. Cook, Administrative Officer
Herbert S. Bennett, NIST Fellow
George G. Harman, EEEL Scientist Emeritus
Erik M. Secula, Information Specialist
Wire Bonding to Cu/Low-k Semiconductor Devices
Theoretical Solid-State Physics for Semiconductors
ENABLING DEVICES AND ICS GROUP
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Michael Gaitan, Group Leader
Terri Kroft, Office Manager
Nano-Structures for CD and Interconnect Metrology
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Michael W. Cresswell, Leader
Richard A. Allen
Harry A. Schafft, Contractor
Emre Yarimbiyik, Guest Researcher
Metrology for System-on-a-Chip
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Allen R. Hefner, Jr., Leader
Muhammad Afridi, Contractor
Colleen E. Hood
Jose Ortiz, Contractor
Ankush Varma, Guest Researcher
Power Device and Thermal Metrology
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Allen R. Hefner, Jr., Project Leader
Adwoa Akuffo, Contractor
Tam Duong, Contractor
Madelaine Hernandez, Contractor
Leonardo Hillkirk, Contractor
Colleen E. Hood
Jose Ortiz, Contractor
Angel Rivera-Lopez, Contractor
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Jon Geist, Project Leader
Richard A. Allen
Pierre-Alain Auroux, Contractor
Jennifer S. Hong
Andreas Jahn, Guest Researcher
Janet C. Marshall
Craig McGray, Contractor
Geraldine I. Mijares
Nicole Morgan, Guest Researcher
Brian Nablo, Post Doc
Milena Racic, Contractor
Darwin Reyes-Hernandez
Joey Robertson, Post Doc
Bharat Sankaran, Guest Reseacher
Jayna Shah, Guest Reseracher
Sam Stavis, Contractor
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John Kasianowicz, Project Leader
Elaine Chan, Post Doc
Louis Hromada, Contractor
Brian Nablo, Post Doc
Joseph Reiner, Post Doc
Joey Robertson, Post Doc
Kenneth Rubinson, Guest Researcher
Martin Misakian, Guest Researcher
CMOS AND NOVEL DEVICES GROUP
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John S. Suehle, Group Leader
Nanoelectronic Device Metrology
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Curt A. Richter, Project Leader
Monica D. Edelstein
Christina Hacker
Nadine Gergel-Hackett, Post Doc
Oleg Kirillov
Joseph J. Kopanski
Qiliang Li, Guest Researcher
John S. Suehle
Wenyong Wang, Guest Researcher
Hao Xiong, Contractor
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David Gundlach, Project Leader
Behrang Hamadani, Post Doc
Oana Jurchescu, Post Doc
Oleg Kirillov
Joseph J. Kopanski
Nhan Van Nguyen
Curt A. Richter
John S. Suehle
Advanced MOS Device Reliability and Characterization
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Charles Cheung, Project Leader
Monica D. Edelstein
Moshe Gurfinkel, Contractor
Nhan Van Nguyen
Hao Xiong, Guest Researcher
ELECTRONIC INFORMATION GROUP
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Kevin G. Brady, Group Leader
Infrastructure for Integrated Electronics Design and Manufacturing
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John Messina, Project Leader
Matthew Aronoff
Julien Baboud, Guest Researcher
Dominique Berton, Guest Researcher
Kevin G. Brady
Neda Khalili, Student
Ya-Shian Li
Cuong Mai, Student
Eric Otema, Guest Researcher
Eric Simmon
Nathan Smith, Student