date data taken (optional) = / /
identifying words (optional)   = 
instrument used (optional)   = 
fabrication facility/process (optional)   =   
test chip name (optional)   =   
test chip number (optional)   =   
filename of 3-D data set (optional)   = 
filename of 2-D data trace (optional) =
 

Table 1 - Preliminary ESTIMATES			Description
1	material =	Poly1 Poly2  stacked Poly1 and Poly2  Metal1 Metal2 SiC-2  SiC-3  other	material
2	design length =	µm	design length
3	which?	first       second  third      other	which iteration of the test structure where "first" corresponds to the topmost or leftmost test structure in the column or array of the same material that has the specified length?
4	magnification =	×	magnification
5	orientation =	0°        90°      other	orientation on the chip
6	calx =		x-calibration factor (for the given magnification)
7	interx =	µm	interferometer's maximum field of view (for the given magnification)
8	σxcal =	µm	one sigma uncertainty in a ruler measurement (for the given magnification)
9	xres =	µm	resolution of the interferometer in the x-direction
10	calz =		z-calibration factor (for the given magnification)
11	aligned?	Yes       No	alignment ensured ?
12	leveled?	Yes       No	data leveled ?

                                      

 

Table 2 - INPUTS (uncalibrated values)			Notes
13	x1max (i.e., x1upper) =	µm
14	x1min (i.e., x1lower) =	µm	(x1min > x1max)
15	x5min (i.e., x5upper) =	µm	(x5min > x1min)
16	x5max (i.e., x5lower) =	µm	(x5max > x5min)
17	sep =	µm	pixel-to-pixel spacing (for the given magnification)
18	which values?	Lower      Upper	Use 'lower' or 'upper' values for calculation ?

                                   


OUTPUTS (calibrated values):
            L_min =  ( x5_min − x1_min ) * calx =  µm
            L_max = ( x5_max − x1_max ) * calx =  µm
            L =  (L_min + L_max ) / 2 = µm
                     u_L = (L_max − L_min ) / 6 = µm
                     u_xcal = (σ_xcal / interx ) * ( L / calx ) = µm
                     u_xres = x_res * calx / 1.732 = µm
            u_c = SQRT [ u_L² + u_xcal² + u_xres² ] = µm

            L_low (using lower values) = ( x5_lower − x1_lower ) * calx = µm
                     u_L-low = (2 * sep * calx) / 3 = µm
                     u_xcal-low = (σ_xcal / interx ) * ( L_low / calx ) = µm
            u_clow = SQRT [ u_L-low² + u_xcal-low² + u_xres²] = µm

            L_up (using upper values) = ( x5_upper − x1_upper ) * calx = µm
                     u_L-up = (2 * sep * calx) / 3 = µm
                     u_xcal-up = (σ_xcal / interx ) * ( L_up / calx ) = µm
            u_cup = SQRT [ u_L-up² + u_xcal-up² + u_xres²] = µm


           (Each of the standard uncertainty components is obtained using a Type B analysis.)

Report the results as follows:  Since it can be assumed that the possible estimated values are either
approximately uniformly distributed or Gaussian with approximate standard deviation u_c, the length
is believed to lie in the interval L ± u_c with a level of confidence of approximately 68 %
assuming a Gaussian distribution. 

---

Modify the input data, given the information supplied in any flagged statement below, if applicable, then recalculate: 1. Please fill out the entire form. 2. The design length should be between 0 µm and 1050 µm. 3. The measured value for L is more than 3uc from the design length. 4. Is the magnification appropriate given the design length ? 5. Magnifications at or less than 2.5× shall not be used. 6. Is 0.95 < calx < 1.05 but not equal to "1" ?  If not, recheck your x-calibration. 7. The value for interx should be between 0 µm and 1500 µm. 8. The value for σxcal should be between 0 µm and 4 µm. 9. The value for xres should be between 0 µm and 1.57 µm. 10.  Is 0.95 < calz < 1.05 but not equal to "1" ?  If not, recheck your z-calibration. 11. Alignment has not been ensured. 12. Data has not been leveled. 13.  x1min should be greater than x1max. 14. x5min should be greater than x1min. 15. x5max should be greater than x5min. 16. The calibrated values for x1min and x1max are greater than 10 µm apart. 17.  The calibrated values for x5min and x5max are greater than 10 µm apart. 18. sep should be between 0 µm and 1.57 µm. Return to Main MEMS Calculator Page. Email questions or comments to mems-support@nist.gov. NIST is an agency of the U.S. Commerce Department's The Semiconductor Electronics Division is within the Electronics and Electrical Engineering Laboratory. The MNT Project (http://www.eeel.nist.gov/812/MNT/index.html) is within the Enabling Devices and ICs Group. Date created: 12/4/2000 Last updated: 1/8/2010