Publication List

Data Acquisition and Conversion

  1. S. K. Tewksbury, F. C. Meyer, D. C. Rollenhagen, H. K. Schoenwetter, and T. M. Souders, "Terminology Related to the Performance of S/H, A/D and D/A Circuits," IEEE Trans. Circuits Syst. CAS-25, No. 7, pp. 419-426 (Jul 1978).
  2. B. F. Field, "A Fast Response Low-Frequency Voltmeter," IEEE Trans. Instrum. Meas. IM-27, No. 4, pp. 368-372 (Dec 1978). Reprinted in Nat. Bur. Stand. (U.S.), Spec. Publ. 705, "Precision Measurement and Calibration: Electricity," A. O. McCoubrey, Ed., pp. 656-660 (Oct 1985).
  3. T. M. Souders, "A Bridge Circuit for the Dynamic Characterization of Sample/Hold Amplifiers," IEEE Trans. Instrum. Meas. IM-27, No. 4, pp. 409-413 (Dec 1978).
  4. H. K. Schoenwetter, "A High-Speed Low-Noise 18-Bit Digital-to-Analog Converter," IEEE Trans. Instrum. Meas. IM-27, No. 4, pp. 413-417 (Dec 1978).
  5. T. M. Souders and D. R. Flach, "A 20 Bit + Sign, Relay Switched D/A Converter," Nat. Bur. Stand. (U.S.), Tech. Note 1105, 21 pages (Oct 1979). [GPO]
  6. T. M. Souders and D. R. Flach, "An Automated Test Set for High Resolution Analog-to-Digital and Digital-to-Analog Converters," IEEE Trans. Instrum. Meas. IM-28, No. 4, pp. 239-244 (Dec 1979).
  7. A. G. Perrey and H. K. Schoenwetter, "A Schottky Diode Bridge Sampling Gate," Nat. Bur. Stand. (U.S.), Tech. Note 1121, 18 pages (May 1980). [GPO]
  8. T. M. Souders and J. A. Lechner, "A Technique for Measuring the Equivalent RMS Input Noise of A/D Converters," IEEE Trans. Instrum. Meas. IM-29, No. 4, pp. 251-256 (Dec 1980).
  9. T. M. Souders, D. R. Flach, and B. A. Bell, "A Calibration Service for Analog-to-Digital and Digital-to-Analog Converters," Nat. Bur. Stand. (U.S.), Tech. Note. 1145, 66 pages (Jul 1981). [GPO]
  10. T. M. Souders and D. R. Flach, "An NBS Calibration Service for A/D and D/A Converters," 1981 International Test Conference Digest, pp. 290-303 (Oct 1981).
  11. T. M. Souders, "A Dynamic Test Method for High-Resolution A/D Converters," IEEE Trans. Instrum. Meas. IM-31, No. 1, pp. 3-5 (Mar 1982).
  12. T. M. Souders and D. R. Flach, "Measurement of the Transient Versus Steady-State Response of Waveform Recorders," Proceedings of the Waveform Recorder Seminar, Boulder, CO, October 1981, Nat. Bur. Stand. (U.S.), Spec. Publ. 634, pp. 27-34 (Jun 1982). [GPO]
  13. D. R. Flach, "Steady-State Tests of Waveform Recorders," Proceedings of the Waveform Recorder Seminar, Boulder, CO, October 1981, Nat. Bur. Stand. (U.S.), Spec. Publ. 634, pp. 7-21 (Jun 1982). [GPO]
  14. J. R. Andrews, N. S. Nahman, and B. A. Bell, "Status of Reference Waveform Standards Development at NBS," Proceedings of the Waveform Recorder Seminar, Boulder, CO, October 1981, Nat. Bur. Stand. (U.S.), Spec. Publ. 634, pp. 69-88 (Jun 1982). [GPO]
  15. J. D. Ramboz, A. R. Ondrejka, and W. E. Anderson, "Sampling-Rate Drift Problems in Transfer Function Analysis of Electrical Power Cables," Proceedings of the Waveform Recorder Seminar, Boulder, CO, October 1981, Nat. Bur. Stand. (U.S.), Spec. Publ. 634, pp. 47-53 (Jun 1982). [GPO]
  16. B. A. Bell, B. F. Field, and T. H. Kibalo, "A Fast Response, Low-Frequency Sampling Voltmeter," Nat. Bur. Stand. (U.S.), Tech. Note 1159, 113 pages (Aug 1982). [GPO]
  17. H. K. Schoenwetter, "A Sensitive Analog Comparator," IEEE Trans. Instrum. Meas. IM-31, No. 4, pp. 266-269 (Dec 1982).
  18. T. M. Souders, D. R. Flach, and T. C. Wong, "An Automated Test Set for the Dynamic Characterization of A/D Converters," IEEE Trans. Instrum. Meas. IM-32, No. 1, pp. 180-186 (Mar 1983).
  19. H. K. Schoenwetter, "High Accuracy Settling Time Measurements," IEEE Trans. Instrum. Meas. IM-32, No. 1, pp. 22-27 (Mar 1983).
  20. B. A. Bell and A. G. Perrey, "Peak Conductance Measurements of GaAs Switching Devices," Picosecond Optoelectronics, Gerard Mourou, ed., Proc. SPIE 439, pp. 128-139 (Aug 1983).
  21. J. R. Andrews, B. A. Bell, and E. E. Baldwin, "Reference Flat Pulse Generator," Nat. Bur. Stand. (U.S.), Tech. Note 1067, 72 pages (Oct 1983). [GPO]
  22. H. K. Schoenwetter, "A Programmable Voltage-Step Generator for Testing Waveform Recorders," IEEE Instrumentation/Measurement Technology Conference Proceedings, pp. 71-72 (Jan 1984).
  23. H. K. Schoenwetter, "A Programmable Precision Voltage-Step Generator for Testing Waveform Recorders," IEEE Trans. Instrum. Meas. IM-33, No. 3, pp. 196-200 (Sep 1984).
  24. T. M. Souders, "Data Converter Test Methods," paper for Digital Methods in Waveform Metrology Seminar, Nat. Bur. Stand. (U.S.), Spec. Publ. 707, "Proceedings of the Seminar on Digital Methods in Waveform Metrology," Barry Bell, Ed., pp. 75-85 (Oct 1985).
  25. H. K. Schoenwetter, "Settling Time Measurements," paper for Digital Methods in Waveform Metrology Seminar, Nat. Bur. Stand. (U.S.), Spec. Publ. 707, "Proceedings of the Seminar on Digital Methods in Waveform Metrology," Barry Bell, Ed., pp. 87-109 (Oct 1985).
  26. N. M. Oldham, "Digital Waveform Synthesis Techniques," paper for Digital Methods in Waveform Metrology Seminar, Nat. Bur. Stand. (U.S.), Spec. Publ. 707, "Proceedings of the Seminar on Digital Methods in Waveform Metrology," Barry Bell, Ed., pp. 1-13 (Oct 1985).
  27. D. R. Flach, "Characterization of Waveform Recorders," paper for Digital Methods in Waveform Metrology Seminar, Nat. Bur. Stand. (U.S.), Spec. Publ. 707, "Proceedings of the Seminar on Digital Methods in Waveform Metrology," Barry Bell, Ed., pp. 31-54 (Oct 1985).
  28. B. A. Bell, Editor, "Proceedings of the Seminar on Digital Methods in Waveform Metrology," Nat. Bur. Stand. (U.S.), Spec. Publ. 707, 177 pages (Oct 1985).
  29. T. M. Souders and G. N. Stenbakken, "Modeling and Test Point Selection for Data Converter Testing," 1985 IEEE International Test Conference Proceedings, IEEE Computer Society, IEEE Philadelphia Section, Nov. 19-21, 1985, Philadelphia, PA, IEEE Press, pp. 813-817 (Nov 1985).
  30. O. B. Laug, G. N. Stenbakken, and T. F. Leedy, "Electrical Performance Tests for Audio Distortion Analyzers," Nat. Bur. Stand. (U.S.), NBSIR 85-3269, 159 pages (Nov 1985). Republished as Nat. Bur. Stand. (U.S.), Tech. Note 1219, 159 pages (Jan 1986).
  31. A. Baghdadi, W. K. Gladden, and D. R. Flach, "Nonlinear Effects of Digitizer Errors in FT-IR Spectroscopy," Applied Spectroscopy, published by the Society for Applied Spectroscopy, Vol. 40, Issue 5, pp. 617-627 (Jul 1986).
  32. H. K. Schoenwetter, D. R. Flach, T. M. Souders, and B. A. Bell, "A Precision Programmable Step Generator for Use in Automated Test Systems," Nat. Bur. Stand. (U.S.) Tech. Note 1230, 100 pages (Dec 1986).
  33. A. G. Perrey, B. A. Bell, and M. J. Treado, "Evaluation of Electronic Monitoring Devices," Nat. Bur. Stand. (U.S.) NBSIR 86-3501, 55 pages (Dec 1986).
  34. G. N. Stenbakken, "Characterizing Square and Triangular Waveforms," IMTC/87 Conference Proceedings, IEEE Instrumentation/Measurement Technology Conference, Boston, MA, April 27-29, 1987, digest published by IEEE, pp. 9-11 (Apr 1987).
  35. T. M. Souders, H. K. Schoenwetter, and P. S. Hetrick, "Characterization of a Sampling Voltage Tracker for Measuring Fast, Repetitive Signals," IMTC/87 Conference Proceedings, IEEE Instrumentation/Measurement Technology Conference, Boston, MA, April 27-29, 1987, digest published by IEEE, pp. 240-243 (Apr 1987).
  36. H. K. Schoenwetter, "Design and Characterization of a Programmable Step Generator with Very Fast Settling Performance," Conference on Precision Electromagnetic Measurements, Gaithersburg, MD, June 23-27, 1986, IEEE Trans. Instrum. Meas., special CPEM'86 Proceedings Issue IM-36, No. 2, pp. 428-432 (Jun 1987).
  37. T. M. Souders and D. R. Flach, "Accurate Frequency Response Determinations from Discrete Step Response Data," Conference on Precision Electromagnetic Measurements, Gaithersburg, MD, June 23-27, 1986, IEEE Trans. Instrum. Meas., special CPEM'86 Proceedings Issue IM-36, No. 2, pp. 433-439 (Jun 1987).
  38. G. N. Stenbakken, "Characterizing Square and Triangular Waveforms," IEEE Instrumentation/Measurement Technology Conference, Boston, MA, April 27-29, 1987, IEEE Trans. Instrum. Meas., special IMTC-1987 Issue IM-36, No. 4, pp. 961-963 (Dec 1987).
  39. T. M. Souders, H. K. Schoenwetter, and P. S. Hetrick, "Characterization of a Sampling Voltage Tracker for Measuring Fast, Repetitive Signals," IEEE Instrumentation/Measurement Technology Conference, Boston, MA, April 27-29, 1987, IEEE Trans. Instrum. Meas., special IMTC-1987 Issue IM-36, No. 4, pp. 956-960 (Dec 1987).
  40. R. S. Turgel, O. B. Laug, and T. F. Leedy, "Electrical Performance Tests for True-RMS Voltmeters," Nat. Bur. Stand. (U.S.), NBSIR 88-3736, 129 pages (Mar 1988).
  41. T. M. Souders and P. S. Hetrick, "Accurate RF Voltage Measurements Using a Sampling Voltage Tracker," digest of Conference on Precision Electromagnetic Measurements (CPEM'88), June 7-10, 1988, Tsukuba Science City, Japan, pp. 270-271 (Jun 1988).
  42. B. A. Bell, A. G. Perrey, and R. A. Sadler, "Gallium Arsenide (GaAs)-Based Photoconductive Switches for Pulse Generation and Sampling Applications in the Nanosecond Regime," IEEE Trans. Instrum. Meas., 38, No. 1, pp. 92-97 (Feb 1989).
  43. H. K. Schoenwetter, "Recent Developments in Digital Oscilloscopes," Proc. IEEE Instrum. and Meas. Tech. Conf., April 25-27, 1989, Washington, DC, publ. by IEEE, New York, NY, pp. 154-155 (Apr 1989).
  44. H. K. Schoenwetter, T. F. Leedy, and O. B. Laug, "Electrical Performance Tests for Storage Oscilloscopes," Nat. Inst. Stand. and Tech., (U.S.), NISTIR 89-4220 (Dec 1989).
  45. N. M. Oldham, W. F. Bruce, C. M. Fu, and A. G. Smith, "An Intercomparison of AC Voltage Using a Digitally Synthesized Source," Proc. IEEE Instrumentation/Measurement Technology Conference (IMTC'89), April 25-27, 1989, Washington, DC, IEEE Trans. Instrum. Meas., 39, No. 1, pp. 6-9 (Feb 1990).
  46. T. M. Souders, D. R. Flach, C. Hagwood, and G. Yang, "The Effects of Timing Jitter in Sampling Systems," Proc. IEEE Instrumentation/Measurement Technology Conference (IMTC'89), April 25-27, 1989, Washington, DC, IEEE Trans. Instrum. Meas., 39, No. 1, pp. 80-85 (Feb 1990).
  47. H. Dai and T. M. Souders, "Time Domain Testing Strategies and Fault Diagnosis for Analog Systems," Proc. IEEE Instrumentation/Measurement Technology Conference (IMTC'89), April 25-27, 1989, Washington, DC, IEEE Trans. Instrum. Meas., 39, No. 1, pp. 157-162 (Feb 1990).
  48. T. M. Souders, D. R. Flach, and J. J. Blair, "Step and Frequency Response Testing of Waveform Recorders," Conf. Record IEEE Instrumentation/Measurement Technology Conference (IMTC'90), Feb. 13-15, 1990, San Jose, CA, pp. 214-220 (Feb 1990).
  49. T. M. Souders, D. R. Flach, and J. J. Blair, "Step and Frequency Response Testing of Waveform Recorders," pub. in "A Guide to Waveform Recorder Testing," pp. 14-20, by The Waveform Measurements and Analysis Committee of the IEEE I&M Society, Piscataway, NJ (Apr 1990).
  50. B. A. Bell, "Standards in Waveform Metrology Based on Digital Techniques," J. Res., Nat. Inst. Stand. and Tech. (U.S.), 95, No. 4, pp. 377-405 (Jul-Aug 1990).
  51. B. A. Bell, A. G. Perrey, and M. J. Treado, "Evaluation of Hands-Free Communication Systems," Nat. Inst. Stand. and Tech. (U.S.), NISTIR 90-4230, 87 pages (Aug 1990).
  52. T. M. Souders and G. N. Stenbakken, "A Comprehensive Approach for Testing Analog and Mixed-Signal Devices," Proc. 1990 Intl. Test Conference, Sep 10-12, 1990, Washington, DC, publ. by ITC, Mount Freedom, NJ, pp. 169-176 (Sep 1990).
  53. T. M. Souders and G. N. Stenbakken, "Cutting the High Cost of Testing," publ. in Spectrum, by IEEE, New York City, NY, pp. 48-51 (Mar 1991).
  54. F. D. Martzloff and A. G. Perrey, "Annotated Bibliography--Diagnostic Methods and Measurements Approaches to Detect Incipient Defects Due to Aging of Cables," prepared for the U.S. Nuclear Regulatory Commission, Nat. Inst. Stand. and Tech. (U.S.), NISTIR-4485, 232 pages (Jul 1991).
  55. A. G. Perrey and B. A. Bell, "Performance Evaluation of Dialed Number Recorders," Nat. Inst. Stand. and Tech. (U.S.), NISTIR-4700, 79 pages (Dec 1991). [For Official Use Only - Available directly from authors]
  56. O. B. Laug, T. M. Souders, and D. R. Flach, "A Custom Integrated Circuit Comparator for High Performance Sampling Applications," Proc. IEEE Instrumentation/Technology Conference (IMTC'92), May 12-14, 1992, Secaucus, NJ, pp. 437-441 (May 1992).
  57. O. B. Laug, T. M. Souders, and D. R. Flach, "A Custom Integrated Circuit Comparator for High Performance Sampling Applications," publ. in IEEE Trans. on Instrum. and Meas., 41, No. 6, publ. by IEEE, New York City, NY, pp. 850-855 (Dec 1992).
  58. G. N. Stenbakken and T. M. Souders, "Developing Linear Error Models for Analog Devices," Proc. Instrum. & Meas. Tech. Conf. '93, May 17-20, 1993, Irvine, CA, publ. by IEEE, New York City, NY, pp. 280-285 (Jun 1993).
  59. S. Avramov and N. M. Oldham, "Automatic Calibration of Inductive Voltage Dividers for the NASA Zeno Experiment," publ. in Rev. of Scientific Instruments, 64, No. 9, pp. 2676-2678 (Sep 1993).
  60. G.-Q. Tong and T. M. Souders, "Compensation of Markov Estimator Errors in Time-Jittered Sampling of Non-Monotonic Signals," publ. in IEEE Trans. Instrum. and Meas., 42, No. 5, pp. 931-935 (Oct 1993).
  61. W. L. Gans, "Semiconductor Reference Waveform Pulse Generator: Interim Progress Report," Report to Army TMDE Support Activity (CCG), Redstone Arsenal, AL, Nat. Inst. of Stand. and Tech. (U.S.), NISTIR 5278R, 66 pages (Dec 1993).
  62. J. P. Deyst and T. M. Souders, "Phase Plane Compensation of the NIST Sampling Comparator System," Proceedings IEEE Instrumentation and Measurement Technology Conference (IMTC/94), May 10-12, 1994, Hamamatsu, Japan, pp. 914-916 (May 1994).
  63. J. P. Deyst, T. M. Souders, and O. M. Solomon, "Bounds on Least-Squares Four-Parameter Sine-Fit Errors Due to Harmonic Distortion and Noise," Proc. IEEE Instrumentation and Measurement Technology Conference (IMTC/94), May 10-12, 1994, Hamamatsu, Japan, pp. 700-703 (May 1994).
  64. N. G. Paulter, Jr., "A Causal Regularizing Deconvolution Filter for Optimal Waveform Reconstruction," IEEE Transactions on Instrumentation and Measurement, 43, Issue 5, pp. 740-747 (Oct 1994).
  65. J. P. Deyst and T. M. Souders, "Bounds on Frequency Response Estimates Derived From Uncertain Step Response Data," Proc. of IEEE Instrumentation and Measurement Technology Conference (IMTC/95), Apr 24-26, 1995, Waltham, MA, pp 252-257 (Apr 1995).
  66. J. P. Deyst, T. M. Souders, and O. M. Solomon, Jr., "Bounds on Least-Squares Four-Parameter Sine-Fit Errors," IEEE Trans. Instrum. Meas., 44, No. 3, pp. 637-642 (Jun 1995).
  67. J. P. Deyst and T. M. Souders, "Bounds on Frequency Response Estimates Derived from Uncertain Step Response Data," IEEE Trans. Instrum. Meas., 45, No. 2, pp. 378-383 (Apr 1996).
  68. J. P. Deyst, T. M. Souders, and J. J. Blair, "Uncertainties of Frequency Response Estimates Derived from Responses to Uncertain Step-Like Inputs," Proc. IEEE Instrumentation and Measurement Technology Conference (IMTC/96), Jun 4-6, 1996, Brussels, Belgium, 1, pp. 151-154 (Jun 1996).
  69. T. M. Souders, B. C. Waltrip, O. B. Laug, and J. P. Deyst, "A Wideband Sampling Voltmeter," Proc. IEEE Instrumentation and Measurement Technology Conference (IMTC/96), Jun 4-6, 1996, Brussels, Belgium, 1, pp. 1139-1144 (Jun 1996).
  70. N. G. Paulter, "Selecting a Short-Pulse Laser System for Photoconductive Generation of High-Speed Electrical Pulses" Optical Engineering, 35, No. 11, Society of Photo-Optical Instrumentation Engineers, pp. 3296-3300 (Nov 1996).
  71. G. N. Stenbakken and J. P. Deyst, "Timebase Distortion Measurements Using Multiphase Sinewaves," Proc. IEEE Instrumentation and Measurement Technology Conference (IMTC/97), May 19-21, 1997, Ottawa, Canada, 2, IEEE #97CH36022, pp. 1003-1008 (May 1997).
  72. T. M. Souders, B. C. Waltrip, O. B. Laug, and J. P. Deyst, "A Wideband Sampling Voltmeter," IEEE Trans. Instrum. Meas., 46, No. 4, pp. 947-953 (Aug 1997).
  73. G. N. Stenbakken and J. P. Deyst, "Comparison of Time Base Nonlinearity Measurements Techniques," IEEE Trans. Instrum. Meas. Special Issue on Selected Papers IMTC/97, 47, No. 1, pp. 34-38 (Feb 1998).
  74. G. N. Stenbakken and J. P. Deyst, "Time-Base Nonlinearity Determination Using Iterated Sine-Fit Analysis," Proc. IEEE Instrumentation and Measurement Technology Conference (IMTC/98), May 18-21, 1998, St. Paul, MN, 2, IEEE No. 98CH36222, pp. 1335-1340 (May 1998).
  75. J. P. Deyst, N. G. Paulter, Jr., T. Daboczi, G. N. Stenbakken, and T. M. Souders, "A Fast Pulse Oscilloscope Calibration System," Proc. IEEE Instrumentation and Measurement Technology Conference (IMTC/98), May 18-20, 1998, St. Paul, MN, 1, IEEE No. 98CH36222, pp. 166-171 (May 1998).
  76. T. M. Souders, "Code Probability Distributions of A/D Converters with Random Input Noise," Proc. IEEE Instrumentation and Measurement Technology Conference (IMTC/98), May 18-20, 1998, St. Paul, MN, 1, IEEE No. 98CH36222, pp. 84-87 (May 1998).
  77. M. Souders, J. Andrews, A. Caravone, J. Deyst, C. Duff, and S. Naboicheck, "A Pulse Measurement Intercomparison," Proc. IEEE Instrumentation and Measurement Technology Conference (IMTC/98), May 18-20, 1998, St. Paul, MN, 1, IEEE No. 98CH36222, pp. 178-183 (May 1998).
  78. N. G. Paulter, "Low-Jitter Trigger System for Pulse Calibration and Intercomparison of High-Speed Samplers," IEEE Trans. Instrum. Meas., 47, No. 3, pp. 606-608 (Jun 1998).
  79. N. G. Paulter, "The Effect of Histogram Size on Histogram-Derived Pulse Parameters," IEEE Trans. Instrum. Meas., 47, No. 3, pp. 609-612 (Jun 1998).
  80. G. N. Stenbakken and J. P. Deyst, "Time-Base Nonlinearity Determination Using Iterated Sine-Fit Analysis," IEEE Trans. Instrum. Meas. Special Issue on Selected Papers IMTC/98, 47, No. 5, pp. 1056-1061 (Oct 1998).
  81. J. P. Deyst, N. G. Paulter, Jr., T. Daboczi, G. N. Stenbakken, and T. M. Souders, "A Fast Pulse Oscilloscope Calibration System," IEEE Trans. Instrum. Meas. Special Issue on Selected Papers IMTC/98, 47, No. 5, pp. 1037-1041 (Oct 1998).
  82. T. M. Souders, J. Andrews, A. Caravone, J. P. Deyst, C. Duff, and S. Naboicheck, "A Pulse Measurement Intercomparison," IEEE Trans. Instrum. Meas. Special Issue on Selected Papers IMTC/98, 47, No. 5, pp. 1031-1036 (Oct 1998).
  83. T. M. Souders, "Code Probability Distributions of A/D Converters with Random Input Noise," IEEE Trans. Instrum. Meas. Special Issue on Selected Papers IMTC/98, 47, No. 5, pp. 1042-1045 (Oct 1998).
  84. N. G. Paulter, "An Accurate Method for Measuring the Dielectric Constant of Printed Wiring Board Materials," Proc. IPC Printed Circuits Expo 1999 Technical Symp., Mar 14-18, 1999, Long Beach, CA, publ. IPC/Assn. Connecting Electronics Industries, Northbrook, IL, pp. S14-4-1 to S14-4-7 (Mar 1999).
  85. N. G. Paulter and R. H. Palm, "A Wide Bandwidth Printed Wiring Board Transmission Line Probe," Proc. IPC Printed Circuits Expo 1999 Technical Symp., Mar 14-18, 1999, Long Beach, CA, publ. IPC/Assn. Connecting Electronics Industries, Northbrook, IL, pp. S19-4-1 to S19-4-4 (Mar 1999).
  86. N. G. Paulter, "An Accurate Method for Measuring the Dielectric Constant of Printed Wiring Board Materials," Circuit World, MCB University Press, 26, No. 1, pp. 27-32 (Oct 1999).
  87. W.-L. Cao, M. Du, C. H. Lee, and N. G. Paulter, "Compact Photoconductive-based Sampling System with Electronic Sampling Delay," Technical Digest of Summaries of papers for Conf. on Lasers and Electro-Optics 2000, May 7-12, 2000, San Francisco, CA, publ. Optical Society of America, Wash., DC, pp. 471-472 (May 2000).
  88. D. R. Larson and N. G. Paulter, "The Effect of Offset Voltage on the Kick-Out Pulses Used in the Nose-to-Nose Sampler Impulse Response Characterization Method," Proc. 17th IEEE Instrumentation and Measurement Technology Conference (IMTC/2000), 3, May 1-4, 2000, Baltimore, MD, pp. 1425-1428 (May 2000).
  89. S. Roy and T. M. Souders, "Non-Iterative Waveform Deconvolution Using Analytic Reconstruction Filters with Time-Domain Weighting," Proc. of 17th IEEE Instrumentation and Measurement Technology Conference (IMTC/2000), 3, May 1-4, 2000, Baltimore, MD, pp. 1429-1434 (May 2000).
  90. B. C. Waltrip, O. B. Laug, G. N. Stenbakken, "Improved Time-Base for Waveform Parameter Estimation," Proc. of 17th Instrumentation and Measurement Technology Conference (IMTC/2000), 3, May 1-4, 2000, Baltimore, MD, pp. 1518-1522 (May 2000).
  91. G. N. Stenbakken, D. Liu, J. A. Starzyk, and B. C. Waltrip, "Nonrandom Quantization Errors in Timebases," Proc. of 17th Instrumentation and Measurement Technology Conference (IMTC/2000), 1, May 1-4, 2000, Baltimore, MD, pp. 235-240 (May 2000).
  92. W. L. Gans, N. S. Nahman, J. R. Andrews, and E. E. Baldwin, "Pulse Transition Duration Measurements and Standards at NIST -- 1975 to 1988," NISTIR 6550, Natl. Inst. of Stand. and Tech (U.S.), 118 pages (Aug 2000).
  93. W.-l. Cao, M. Du, C. H. Lee, and N. G. Paulter, "High Frequency and Broadband Signal Measurements by Ultrafast Opto-Microwave Intermixing and Sampling," Intl. Topical Meeting on Microwave Photonics MWP 2000, Sep 11-13, 2000, St. John's College, Oxford, UK, organizer-Inst. of Electrical Engrs. (UK), pp. 207-209 (Sep 2000).
  94. N. G. Paulter and D. R. Larson, "Improving the Uncertainty Analysis of NIST's Pulse Parameter Measurement Service," 56th ARFTG Conf. Digest, Metrology and Test for RF Telecommunications, Automatic Radio Frequency Techniques Group, Nov 30-Dec 1, 2000, Boulder, CO, pp. 16-24 (Nov 2000).
  95. O. M. Solomon, Jr., D. R. Larson, and N. G. Paulter, "Comparison of Some Algorithms to Estimate the Low and High State Level of Pulses," Proc. of 18th Instrumentation and Measurement Technology Conference (IMTC/2001), May 21-23, 2001, Budapest, Hungary, pp. 96-101 (May 2001).