Publication List

Resistance Measurements

  1. D. B. Sullivan and R. F. Dziuba, "Low Temperature Direct Current Comparators," Rev. Sci. Instrum. 45, No. 4, pp. 517-519 (Apr 1974).
  2. D. B. Sullivan and R. F. Dziuba, "A Low-Temperature Direct-Current Comparator Bridge," IEEE Trans. Instrum. Meas., IM-23, No. 4, pp. 256-260 (Dec 1974).
  3. R. F. Dziuba and D. B. Sullivan, "Cryogenic Direct Current Comparators and Their Applications," IEEE Trans. Magn., MAG-11, No. 2, pp. 716-719 (Mar 1975).
  4. R. J. Wagner, M. E. Cage, B. F. Field, R. F. Dziuba, A. C. Gossard, and D. C. Tsui, "Precision Comparison of the Quantized Hall Resistance in Si and GaAs Inversion," Bull. Am. Phys. Soc. 28, p. 365 (1983).
  5. K. R. Baker and R. F. Dziuba, "Automated NBS 1-Í Measurement System," IEEE Trans. Instrum. Meas., IM-32, No. 1, pp. 154-158 (Mar 1983).
  6. M. E. Cage, R. F. Dziuba, and B. F. Field, "A Possible Quantum Hall Effect Resistance Standard," NCSL Newsletter 23, No. 1, pp. 16-20 (Mar 1983).
  7. M. E. Cage, R. F. Dziuba, R. J. Wagner, D. C. Tsui, A. C. Gossard, B. F. Field and N. N. Tadros, "Progress Report on Investigations of the Quantum Hall Effect as a Possible Resistance Standard," Document CCE/83-32 submitted to the 16th Session of the Consultative Committee on Electricity, International Committee on Weights and Measures (Mar 1983).
  8. M. E. Cage, B. F. Field, R. F. Dziuba, S. M. Girvin, A. C. Gossard, and D. C. Tsui, "The Temperature Dependence of the Quantum Hall Resistance," Phys. Rev. B 30, No. 4, pp. 2286-2288 (Aug 1984).
  9. M. E. Cage, R. F. Dziuba, and B. F. Field, "A Test of the Quantum Hall Effect as a Resistance Standard," IEEE Trans. Instrum. Meas., IM-34, No. 2, pp. 301-303 (Jun 1985).
  10. B. F. Field, "A High-Accuracy Automated Resistance Bridge for Measuring Quantum Hall Devices," IEEE Trans. Instrum. Meas. IM-34, No. 2, pp. 320-322 (Jun 1985).
  11. M. E. Cage, "Chapter II, Experimental Aspects and Metrological Applications of the Integer Quantum Hall Effect," Quantum Hall Effect, Springer-Verlagen: Berlin, FRG, pp. 37-68 (1986).
  12. R. F. Dziuba and J. Kinoshita, "Automated Cryogenic Current Comparator Resistance Bridge," 1986 Conference on Precision Electromagnetic Measurements (CPEM'86), Gaithersburg, MD, June 23-27, 1986, IEEE Cat. No. 86CH2267-3, pp. 200-201 (Jun 1986).
  13. R. F. Dziuba, "The NBS Ohm: Past-Present-Future," Proceedings of the 1987 Measurement Science Conference, Session No. VI-A, pp. 15-27, Irvine, CA, January 29-30, 1987 (Jan 1987).
  14. M. E. Cage, R. F. Dziuba, B. F. Field, T. E. Kiess, and C. T. Van Degrift, "Monitoring the U.S. Legal Unit of Resistance via the Quantum Hall Effect," IEEE Trans. Instrum. Meas., IM-36, No. 2, pp. 222-225 (Jun 1987).
  15. B. W. Ricketts and M. E. Cage, "Quantized Hall Resistance Measurements at the National Measurement Laboratory, Australia," IEEE Trans. Instrum. Meas., IM-36, No. 2, pp. 245-248 (Jun 1987).
  16. G. M. Reedtz and M. E. Cage, "An Automated Potentiometric System for Precision Measurement of the Quantized Hall Resistance," J. Res., Nat. Bur. Stand. (U.S.), 92, No. 5, pp. 303-310 (Sep-Oct 1987).
  17. R. F. Dziuba, D. G. Jarrett, and J. D. Neal, "Wide-Range Automated System for Measuring Standard Resistors," 1988 Conference on Precision Electromagnetic Measurements (CPEM'88) Digest, Tsukuba Science City, Japan, June 7-10, 1988, pp. 158-159 (Jun 1988).
  18. M. E. Cage, R. F. Dziuba, C. T. Van Degrift, and D. Y. Yu, "Determination of the Time-dependence of NBS Ohm Using the Quantized Hall Resistance," IEEE Trans. Instrum. Meas., IM-38, No. 2, pp. 263-269 (Apr 1989).
  19. J. Q. Shields, R. F. Dziuba, and H. P. Layer, "New Realization of the Ohm and Farad Using the NBS Calculable Capacitor," IEEE Trans. Instrum. Meas., IM-38, No. 2, pp. 249-251 (Apr 1989).
  20. M. E. Cage, R. F. Dziuba, J. Q. Shields, P. C. Coogan, B. W. Ricketts, and G. W. Small, "Comparisons of the NML and NIST Representations of the Ohm Using Transportable 1 ohm, 10 kilohm, 10 pF, and Quantized-Hall-Resistance Standards," Metrologia 26, pp. 229-234 (Oct 1989).
  21. R. E. Elmquist and R. F. Dziuba, "Isolated Ramping Current Sources for a Cryogenic Current Comparator Bridge," publ. in Rev. Sci. Instrum., 62, No. 10, pp. 2457-2460 (Oct 1991).
  22. D. G. Jarrett and R. F. Dziuba, "Automated AC Bridge for the Measurement of Resistors Over the Frequency Range 10 Hz to 10 kHz," Conf. Record of Conference on Precision Electromagnetic Measurements (CPEM'92), June 9-12, 1992, Paris, France, pp. 87-88 (Jun 1992).
  23. R. F. Dziuba and R. E. Elmquist, "Improvements in Resistance Scaling at NIST Using Cryogenic Current Comparators," Conf. Record of Conference on Precision Electromagnetic Measurements (CPEM'92), June 9-12, 1992, Paris, France, pp. 284-285 (Jun 1992).
  24. R. E. Elmquist, "Detection of Leakage Errors in Cryogenic Current Comparator Bridges," Conf. Record of Conference on Precision Electromagnetic Measurements (CPEM'92), June 9-12, 1992, Paris, France, pp. 276-277 (Jun 1992).
  25. P. A. Boynton, "An Automated System for the Measurement of High-Valued Resistors," Conf. Record of Conference on Precision Electromagnetic Measurements (CPEM'92), June 9-12, 1992, Paris, France, pp. 278-279 (Jun 1992).
  26. D. G. Jarrett, "Automated AC Bridge for Resistance Measurements," Conf. Proc. National Conference of Standards Laboratories (NCSL), Washington, DC, August 2-6, 1992, pp. 563-567 (Aug 1992).
  27. P. A. Boynton, "An Automated System for the Measurement of High-Valued Resistors," Conf. Proc. National Conference of Standards Laboratories (NCSL), Washington, DC, August 2-6, 1992, pp. 617-621 (Aug 1992).
  28. R. F. Dziuba, P. B. Boynton, R. E. Elmquist, D. G. Jarrett, T. P. Moore, and J. D. Neal, "NIST Measurement Service for DC Standard Resistors," Nat. Inst. Stand. and Tech. (U.S.), NIST TN 1298, 65 pages (Nov 1992).
  29. R. F. Dziuba and R. E. Elmquist, "Improvements in Resistance Scaling at NIST Using Cryogenic Current Comparators," Conference on Precision Electromagnetic Measurements (CPEM'92), June 9-12, 1992, Paris, France, publ. by IEEE in Trans. Instrum. Meas., 42, No. 2, pp. 126-130 (Apr 1993).
  30. R. E. Elmquist, "Detection of Leakage Errors in Cryogenic Current Comparator Bridges," Conference on Precision Electromagnetic Measurements (CPEM'92), June 9-12, 1992, Paris, France, publ. by IEEE Trans. Instrum. Meas., 42, No. 2, pp. 167-169 (Apr 1993).
  31. R. F. Dziuba,"Pressure Dependencies of Standard Resistors," Proc. National Conference of Standards Laboratories (NCSL) Workshop and Symposium, July 25-29, 1993, Albuquerque, NM, pp. 363-369 (Jul 1993).
  32. K. C. Lee, M. E. Cage, and P. S. Rowe, "Sources of Uncertainty in a DVM-Based Measurement System for a Quantized Hall Resistance Standard," J. Res. Nat. Inst. Stand. and Tech. 99 (3), pp. 227-240 (May/Jun 1994).
  33. R. E. Elmquist and R. F. Dziuba, "A High-Temperature Superconductor Cryogenic Current Comparator," Proc./Digest of the Conference on Precision Electromagnetic Measurements (CPEM'94), June 27-July 1, 1994, Boulder, CO, pp. 136-137 (Jul 1994).
  34. D. G. Jarrett and T. P. Moore, "Improvements to Automated System for Measuring Standard Resistors at NIST," Proc. (handout) 1994 National Conference of Standards Laboratories Workshop and Symposium (NCSL), July 31-August 4, 1994, Chicago, IL (Jul 1994).
  35. R. E. Elmquist, "Status of the Quantum Hall Resistance RISP," Proc. National Conference of Standards Laboratories 1994 Workshop and Symposium Proceedings, July 31-August 4, 1994, Chicago, IL (Jul 1994).
  36. K. C. Lee and M. E. Cage, "Design Challenges of a Commercial QHE-based Resistance Standard," Nat. Inst. of Stand. and Tech., (U.S.), NISTIR 5533, 32 pages (Nov 1994).
  37. R. E. Elmquist and R. F. Dziuba, "High-Temperature Superconductor Cryogenic Current Comparator," IEEE Trans. Instrum. Meas., 44, No. 2, pp. 262-264 (Apr 1995).
  38. K. C. Lee, "Bonding Wires to Quantized Hall Resistors," IEEE Trans. Instrum. Meas., 44, No. 2, pp. 249-252 (Apr 1995).
  39. K. C. Lee, "Quantum Hall Effect-Based Resistance Standard: Capabilities and Implementation" Proc. 18th Annual Workshop NASA Metrology and Calibration 1995, Apr 18-20, 1995, Greenbelt, MD, pp. 1-12 (Apr 1995).
  40. M. E. Cage and C. F. Lavine, "Using Quantized Breakdown Voltage Signals to Determine the Maximum Electric Fields in a Quantum Hall Effect Sample," J. Res., Nat. Inst. of Stand. and Tech. (U.S.), 100, No. 3, pp. 269-276 (May-Jun 1995).
  41. R. F. Dziuba, "Automated Resistance Measurements at NIST," Proc. 1995 National Conference of Standards Laboratories (NCSL) Workshop and Symposium, Jul 16-20, 1995, Dallas, TX, pp. 189-195 (Jul 1995).
  42. D. G. Jarrett, "Constant Temperature and Humidity Chamber for Standard Resistors," Proc. 1995 National Conference of Standards Laboratories (NCSL) Workshop and Symposium, Jul 16-20, 1995, Dallas, TX, pp. 501-505 (Jul 1995).
  43. R. E. Elmquist, "Progress on the Quantized Hall Resistance Recommended Intrinsic/Derived Standards Practice," Proc. 1995 National Conference of Standards Laboratories (NCSL) Workshop and Symposium, Jul 16-20, 1995, Dallas, TX, pp. 647-653 (Jul 1995).
  44. L. L. Kile, "Programmable Guarded Coaxial Connector Panel," Proc. 1995 National Conference of Standards Laboratories (NCSL) Workshop and Symposium, Jul 16-20, 1995, Dallas, TX, pp. 285-289 (Jul 1995).
  45. A. Jeffery, R. E. Elmquist and M. E. Cage, "Precision Tests of a Quantum Hall Effect Device DC Equivalent Circuit Using Double-Series and Triple-Series Connections" J. Res., Nat. Inst. of Stand. and Tech. (U.S.), 100, No. 6, pp. 677-685 (Nov-Dec 1995).
  46. M. E. Cage, "Evidence that Voltage Rather than Resistance is Quantized in Breakdown of the Quantum Hall Effect," J. Res., Nat. Inst. of Stand. and Tech. (U.S.), pp. 175-180 (Mar-Apr 1996).
  47. K. C. Lee, "Quantum Hall Effect-Based Resistance Standard," Proc. Nineteenth Annual Workshop NASA Metrology and Calibration 1996, Feb 26-Mar 1, 1996, Cocoa Beach, FL, pp. 577-594 (May 1996).
  48. R. E. Elmquist and R. F. Dziuba, "Loading Effects in Resistance Scaling," Digest Conf. on Precision Electromagnetic Measurements (CPEM'96), Jun 17-20, 1996, Braunschweig, Germany, pp. 334-335 (Jun 1996).
  49. J. A. Marshall, T. A. Marshall, D. G. Jarrett, and R. F. Dziuba, "A Low Thermal Guarded Scanner for High Resistance Measurement Systems," Digest Conf. on Precision Electromagnetic Measurements (CPEM'96), Jun 17-20, 1996, Braunschweig, Germany, pp. 20-21 (Jun 1996).
  50. D. G. Jarrett, "Automated Guarded Bridge for Calibration of Multimegohm Standard Resistors,"Digest Conf. on Precision Electromagnetic Measurements (CPEM'96), Jun 17-20, 1996, Braunschweig, Germany, pp. 336-337 (Jun 1996).
  51. A. Jeffery, R. E. Elmquist, L. H. Lee, J. Q. Shields, and R. F. Dziuba, "NIST Comparison of the Quantized Hall Resistance and the Realization of the SI Ohm Through the Calculable Capacitor,"Digest Conf. on Precision Electromagnetic Measurements (CPEM'96), Jun 17-20, 1996, Braunschweig, Germany, pp. 10-11 (Jun 1996).
  52. R. F. Dziuba, "Resistors," Encyclopedia of Applied Physics, VCH Publishers, Inc., New York, NY, 16, pp. 423-435 (Jul 1996).
  53. D. G. Jarrett, "Resistance Measurements from 10 Mohms to 1 Teraohms at NIST," Proc. 1996 Natl. Conf. of Standards Laboratories (NCSL) Workshop and Symposium, Aug 25-29, 1996, Monterey, CA, pp. 291-298 (Aug 1996).
  54. R. E. Elmquist and R. F. Dziuba, "Loading Effects in Resistance Scaling," IEEE Trans. Instrum. Meas. Special Issue on Selected Papers CPEM'96, 46, No. 2, pp. 322-324 (Apr 1997).
  55. D. G. Jarrett, "Automated Guarded Bridge for Calibration of Multimegohm Standard Resistors from 10 Mohms to 1 Teraohms," IEEE Trans. Instrum. Meas. Special Issue on Selected Papers CPEM'96, 46, No. 2, pp. 325-328 (Apr 1997).
  56. R. F. Dziuba and L. L. Kile, "An Automated Guarded Bridge System for the Comparison of 10 kohm Standard Resistors," Proc. IEEE Instrumentation and Measurement Technology Conference (IMTC/97), May 19-21, 1997, Ottawa, Canada, 1, IEEE #97CH36022, pp. 394-396 (May 1997).
  57. P. A. Boynton, J. E. Sims, and R. F. Dziuba, "NIST Measurement Assurance Program for Resistance," Natl. Inst. of Stand. and Technol. (U.S.), Tech. Note 1424, 53 pages (Nov 1997).
  58. M. E. Cage, A. Jeffery, and R. E. Elmquist, "Suggested Triple-Series Connection Measurement Tests of the AC Quantized Hall Resistance and the AC Longitudinal Resistance," Conf. on Precision Electromagnetic Measurements Digest (CPEM'98), Jul 6-10, 1998, Washington, DC, pp. 341-342 (Jul 1998).
  59. R. F. Dziuba, D. G. Jarrett, L. L. Scott, and A. J. Secula, "Fabrication of High-Value Standard Resistors," Conf. on Precision Electromagnetic Measurements Digest (CPEM'98), Jul 6-10, 1998, Washington, DC, pp. 309-310 (Jul 1998).
  60. R. F. Dziuba and J. E. Sims, "Resistance Measurement Assurance Program at NIST," 1998 Natl. Conf. of Standards Laboratories Workshop and Symp. (NCSL), Jul 19-23, 1998, Albuquerque, NM, pp. 767-777 (Jul 1998).
  61. L. L. Scott, "Improvements in 10 Kilohm Resistance Measurements at NIST," 1998 Natl. Conf. of Standards Laboratories Workshop and Symp. (NCSL), Jul 19-23, 1998, Albuquerque, NM, pp. 519-524 (Jul 1998).
  62. K. C. Lee, "Dependence of Contact Resistance on Current for Good and Bad Ohmic Contacts to Quantized Hall Resistors," Conf. on Precision Electromagnetic Measurements Digest (CPEM'98), Jul 6-10, 1998, Washington, DC, pp. 477-478 (Jul 1998).
  63. D. Jarrett, "A Guarded Transfer Standard for High Resistance Measurements," Conf. on Precision Electromagnetic Measurements Digest (CPEM'98), Jul 6-10, 1998, Washington, DC, pp. 100-101 (Jul 1998).
  64. D. G. Jarrett, "Evaluation of Guarded High-Resistance Hamon Transfer Standards," IEEE Trans. Instrum. Meas., Special Issue on Selected Papers CPEM'98, 48, No. 2, pp. 324-328 (Apr 1999).
  65. R. F. Dziuba, D. G. Jarrett, L. L. Scott, and A. J. Secula, "Fabrication of High-Value Standard Resistors," IEEE Trans. Instrum. Meas., Special Issue on Selected Papers CPEM'98, 48, No. 2, pp. 333-337 (Apr 1999).
  66. R. E. Elmquist, "Cryogenic Current Comparator Measurements at 77 K Using Thallium-2223 Thick-film Shields," IEEE Trans. Instrum. Meas., Special Issue on Selected Papers CPEM'98, 48, No. 2, pp. 383-386 (Apr 1999).
  67. R. E. Elmquist, "Calculable Coaxial Resistors for Precision Measurements," Proc. 16th IEEE Instrumentation and Measurement Technology Conference (IMTC/99), May 24-26, 1999, Venice, Italy, 3, IEEE No. 99CH36309, IEEE Service Center, Piscataway, NJ, pp. 1468-1471 (May 1999).
  68. R. F. Dziuba and L. L. Kile, "An Automated Guarded Bridge System for the Comparison of 10 kW Standard Resistors," IEEE Trans. Instrum. Meas., 48, No. 3, pp. 673-677 (Jun 1999).
  69. D. G. Jarrett, J. A. Marshall, T. A. Marshall, and R. F. Dziuba, "Design and Evaluation of a Low Thermal Electromotive Force Guarded Scanner for Resistance Measurements," Rev. Sci. Instrum., publ. Amer. Inst. of Physics, 70, No. 6, pp. 2866-2871 (Jun 1999).
  70. D. G. Jarrett, R. F. Dziuba, and M. E. Kraft, "A Comparison of 1 TW and 10 TW High Resistance Standards Between NIST and Sandia," Proc. 1999 Natl. Conf. of Standards Laboratories Workshop and Symp. (NCSL), Jul 11-15, 1999, Charlotte, NC, pp. 65-72 (Jul 1999).
  71. T. J. Witt, D. Reymann, Y-h. Tang, and C. A. Hamilton, "Bilateral Comparison of 10 V Standards Between the NIST, Gaithersburg, the NIST, Boulder, and the BIPM, October 1998 to January 1999," Bureau International des Poids et Mesures (BIPM) Report 99-07, BIPM Sevres, Cedex, France, 13 pages (Aug 1999).
  72. F. Delahay, T. J. Witt, R. E. Elmquist, and R. F. Dziuba, "Comparison of Quantum Hall Effect Resistance Standards of the NIST and the BIPM," Metrologia, 37, pp. 173-176 (2000).
  73. R. E. Elmquist, "Calculable Coaxial Resistors for Precision Measurements," IEEE Trans. Instrum. Meas. Special Issue on Selected Papers IMTC'99, 49, No. 2, pp. 210-215 (Apr 2000).
  74. R. E. Elmquist, A. Jeffery, and D. G. Jarrett, "Characterization of Four-Terminal-Pair Resistance Standards: A Comparison of Measurements and Theory," Digest of Conf. on Precision Electromagnetic Measurements (CPEM2000), May 14-19, 2000, Sydney, Australia, pp. 439-440 (May 2000).
  75. D. G. Jarrett, "A Dual-Balance High-Resistance Bridge in the Range of 1 TO to 100 TO," Digest of Conf. on Precision Electromagnetic Measurements (CPEM2000), May 14-19, 2000, Sydney, Australia, pp. 295-296 (May 2000).
  76. R. E. Elmquist, "What Metrology Gains With Quantized Resistance Standards," Proc. Metrologia 2000 Conference, Dec 4-7, 2000, Sao Paulo, Brazil, http://www.sbmetrologia.org.br/metrologia2000 (Dec 2000).
  77. R. E. Elmquist, A.-M. Jeffery, and D. G. Jarrett, "Characterization of Four-Terminal-Pair Resistance Standards: A Comparison of Measurements and Theory," IEEE Trans. Instrum. Meas. Special Issue on Selected Papers CPEM'2000, 50, No. 2, pp. 267-271 (Apr 2001).
  78. B. Schumacher, P. Warnecke, W. Poirier, I. Delgado, Z. Msimang, G. Boella, P. O. Hetland, R. E. Elmquist, J. Williams, D. Inglis, B. Jeckelmann, O. Gunnarsson, and A. Satrapinsky, "Transport Behavior of Commercially Available 100-W Standard Resistors," IEEE Trans. Instrumen. Meas. Special Issue on Selected Papers CPEM'2000, 50, No. 2, pp. 242-244 (Apr 2001).
  79. D. G. Jarrett, "Analysis of a Dual-Balance High-Resistance Bridge at 10 TW," IEEE Trans. Instrum. Meas. Special Issue on Selected Papers CPEM'2000, 50, No. 2, pp. 249-254 (Apr 2001).